QuickSyllabus

表面ナノ・マイクロ計測制御学 / Nano- and Micro-Surface Metrology and Engineering

単位数: 2. 担当教員: 矢代航. 開講年度: 2024. 開講言語: English.

授業の目的・概要及び達成方法等

Google Classroomのクラスコードは工学研究科Webページ
https://www.eng.tohoku.ac.jp/edu/syllabus-g.html
（大学院シラバス・時間割・履修登録）にて確認すること。

Measurement and control are the two wheels of manufacturing. The aim of this lecture is to learn the history of the development of conventional techniques for measurement and control methods covering a wide range of spatial scales from atomic to macroscopic scales of surfaces and interfaces that govern the function of materials. The ultimate goal of this lecture is to develop the ability to analyze for oneself what the limits of conventional measurement and control techniques are, and what problems have been essentially solved to open up new frontiers.

授業の目的・概要及び達成方法等(Ｅ）

The class code for Google Classroom can be found on the Web site of the School of Engineering:
https://www.eng.tohoku.ac.jp/english/academics/master.html (under "Timetable & Course Description")

Measurement and control are the two wheels of manufacturing. The aim of this lecture is to learn the history of the development of conventional techniques for measurement and control methods covering a wide range of spatial scales from atomic to macroscopic scales of surfaces and interfaces that govern the function of materials. The ultimate goal of this lecture is to develop the ability to analyze for oneself what the limits of conventional measurement and control techniques are, and what problems have been essentially solved to open up new frontiers.

他の授業科目との関連及び履修上の注意

A basic knowledge of "Quantum Mechanics", "Electromagnetics", "Thermodynamics", and "Tribology" are useful to understand the lecture.

他の授業科目との関連及び履修上の注意(Ｅ）

Basic knowledge of "Quantum Mechanics", "Electromagnetics", "Thermodynamics", and "Tribology" are useful to understand the lecture.

授業計画

1. Introduction: surface and interface
2. Imaging of surfaces and interfaces I
3. Imaging of surfaces and interfaces II
4. Surface and interface structure analysis I
5. Surface and interface structure analysis II
6. Surface and interface structure analysis II
7. Electronic structure measurement of surfaces and interfaces I
8. Electronic structure measurement of surfaces and interfaces II
9. Characterization of surface dynamics I
10. Characterization of surface dynamics II
11. Thin film growth I
12. Thin film growth II
13. Structural control and function of surfaces I
14. Structural control and function of surfaces II
15. Structural control and function of surfaces III

授業計画(Ｅ）

授業時間外学習

Students are required to make a thorough review, mainly by completing assignments (report questions).

授業時間外学習（Ｅ）

Students are required to make a thorough review, mainly by completing assignments (report questions).

成績評価方法及び基準

Submitted reports and attendance are evaluated.

成績評価方法及び基準(Ｅ）